86-13937153820
No.72,Beihuan Road, Zhengzhou
1.Feature and Description
1. Integrated scanning probe and sample stag enhanced the anti-interference ability.
2 Precision laser and probe positioning device make changing the probe and adjusting the spot simple and convenient.
3. By using the sample probe approaching manner,the needle could perpendicular to the sample scanning.
4. Automatic pulse motor drive control sample probe vertical approaching, to achieve precise positioning of the scanning area.
5. Sample scanning area of interest could freely moved by using the design of high precision sample mobile device.
6. CCD observation system with optical positioning achieves real-time observation and positioning of the probe sample scan area.
7. The design of electronic control system of modularization facilitated maintenance and continuous improvement of circuit.
8. The integration of multiple scanning mode control circuit, cooperate with software system.
9. Spring suspension which simple and practical enhanced anti-interference ability.
2.Picture for Our product
3.Usage and Application
Atomic Force Microscope (AFM), an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It studies the surface texture and properties of a substance by detecting the extremely weak interatomic interaction between the surface of the sample to be tested and a micro-force sensitive element. A pair of weakly sensitive micro-cantilever ends are fixed, and the other end of the small needle tip close to the sample, then it will interact with it, the force will make the micro-cantilever deformation or movement state changes. When scanning the sample, the sensor can be used to detect these changes, we can get the distribution of force information, so as to obtain the surface morphology of nano-resolution information and surface roughness information.
4.Technical data
Work mode | FM-Tapping, optional contact, friction, phase,magnetic or electrostatic |
Size | Φ≤90mm,H≤20mm |
Scanning range | 20 mmin XYdirection,2 mm in Z direction |
Scanning resolution | 0.2nm in XY direction,0.05nm in Z direction |
Movementrange of sample | ±6.5mm |
Pulse width ofthe motor approaches | 10±2ms |
Image sampling point | 256×256,512×512 |
optical magnification | 4X |
optical resolution | 2.5 mm |
Scan rate | 0.6Hz~4.34Hz |
scan angle | 0°~360° |
| Scanning control | 18-bit D/A in XY direction,16-bit D/A in Z direction |
Data sampling | 14-bitA/D,double16-bit A/D multi-channel synchronous sampling |
Feedback | DSP digital feedback. |
Feedbacksampling rate | 64.0KHz |
Computer interface | USB2.0 |
| Operating environment | Windows98/2000/XP/7/8 |
5.Packing and Shipping
Package : Wooden case package
Shipping : 5days
1.How to choose the correct Atomic Force Microscope ? Please send us your purpose,we will give you correct suggestion,divided into Teaching purpose and Scientific research purpose. |
2.What is standard work mode? Touch mode and Tapping mode are standard configuration.Others like friction, phase,magnetic or electrostatic are optional |
3.What is payment terms ? We accept 100% prepay by T/T,Western Union,Money Gram,L/C |
4.What is your gurantte? We have 1year gurantte time and whole life afterservice and maintanance. |
5.If machine broken,how to deal with ? Please open the cargo when you receive it,if broken caused by transporation,claim for express,and at mean time,we will ship you new replace one. |
1.Company Show
2.Factory Show
1.Certificaton
2.Warranty And After-sale Service
♥♥We Supply 1 Year Warranty , And Lifelong Free Technical Guiding And Training♥♥
