86-13937153820
No.72,Beihuan Road, Zhengzhou
Feature and Description
1: Optical,mechanical and electronic integration, simple outline structure.
2: Integrated scanning probe and sample stage improves the anti-interference ability.
3: Precision laser and probe positioning device make changing the probe and adjusting the spot simple and convenient.
4: Different with other suppliers, our device changes the sample probe approaching sample mode to the sample approaching probe mode. It’s a really efficient way to protect the cantiliver broken from miss operation.
5. Automatic step motor drive controls the sample probe vertical approaching, to achieve precise positioning of the scanning area.
6. Sample scanning area of interest may be freely moved by using an high precision wide-range X-Y stage.
7. High precision and wide range piezo-scanner, multiple choice according to different precision and scanning range .
8. 10xapochromat CCD optical positioning system achieve real-time observation and positioning of the sample scan area.
9. The design of the modular electronic control system facilitates maintenance and continuous improvement.
10. The integration of multiple scanning mode control circuit,cooperate with software system.( Windows98/2000/XP/7/8/10)
Picture for Our product
Usage and Application
Atomic Force Microscope (AFM), an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It studies the surface structure and properties of a substance by detecting the extremely weak interatomic interaction between the surface of the sample to be tested and a micro-force sensitive element. Will be a pair of weak force extremely sensitive micro-cantilever end fixed, the other end of the small tip close to the sample, then it will interact with it, the force will make the micro-cantilever deformation or movement state changes. When scanning the sample, the sensor can be used to detect these changes, we can get the distribution of force information, so as to obtain the surface morphology of nano-resolution information and surface roughness information.
Technical data
Work mode | FM-Tapping, optional contact, friction, phase,magnetic or electrostatic |
Size | Φ≤90mm,H≤20mm |
Scanning range | 50mm in XYdirection,5 mm in Z direction, alternative: 20 mm in XY direction,2mm in Z direction |
Scanning resolution | 0.2nm in XY direction,0.05nm in Z direction |
Movement range of sample | ±10mm |
Pulse width ofthe motor approaches | 10±2ms |
Image sampling point | 256×256,512×512 |
Optical magnification | 10X |
Optical resolution | 1 mm |
Scan rate | 0.6Hz~4.34Hz |
Scan angle | 0°~360° |
Scanning control | 18-bit D/A in XY direction,16-bit D/A in Z direction |
Data sampling | 14-bitA/D,double16-bit A/D multi-channel synchronous sampling |
Feedback | DSP digital feedback |
Feedback sampling rate | 64.0KHz |
Computer interface | USB2.0 |
Operating environment | Windows98/2000/XP/7/8 |
Packing and Shipping
Package : Wooden case package
Shipping : 5days
1.How to choose the correct Atomic Force Microscope ? Please send us your purpose,we will give you correct suggestion,divided into Teaching purpose and Scientific research purpose. |
2.What is standard work mode? Touch mode and Tapping mode are standard configuration.Others like friction, phase,magnetic or electrostatic are optional |
3.What is payment terms ? We accept 100% prepay by T/T,Western Union,Money Gram,L/C |
4.What is your gurantte? We have 1year gurantte time. |
5.If machine broken,how to deal with ? Please open the cargo when you receive it,if broken caused by transporation,claim for express,and at mean time,we will ship you new replace one. |
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1.Certificaton
2.Warranty And After-sale Service
♥♥We Supply 1 Year Warranty , And Lifelong Free Technical Guiding And Training♥♥
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